FPGA testing technology and ATE to achieve
Ziyun Wang · Computer Engineering and Applications Journal · 2011
With the FPGA size and complexity increasing,the test is very important.This paper describes the structure of the SRAM-based FPGA profiles and FPGA testing methods to Xilinx's spartan3 series chip,for example,using the multi-detection logic cel(lCLB) mixed-fault testing methods,elaborate on how to achieve on-line FPGA configuration,functions and parameters testing on the Automatic Test System(ATE).A practical approach for the FPGA application-oriented test is provided.