An effective BIST circuit for barrel shifter within 8 bits MCU
Lenian He · Journal of Circuits and Systems · 2007
A novel deterministic built-in self-test(BIST) scheme for barrel shifter embedded in 8 bits MCU datapath is proposed,and the validation is also provided.With this scheme,5 D-type registers are required and 16 patterns are generated during 16 test clock cycles,while the fault testing coverage can reach 100%.This scheme is also fit for DFT for general 2N(N≥4) bits barrel shifter.