A Low Cost Test Method for UHF RFID Centralized CP
Pei Wan-l · Yuhang jice jishu · 2013
With the rapid development of electronic products,improving the quality of the product,while decreasing product prices is also attended by consumers. Array of electronic products for a low price,the core chip production costs need to be reduced firstly. In passive UHF RFID( Radio Frequency Identification) area,test cost is large percent of the total cost. Therefore a novel centralized CP test method is proposed. Compared with the current test method,which is testing parallel 8 chips every time,the test time of one group centralized CP test method can be optimized for more than 68%. If changing the number of chips existing in the single test group or adopting multi-groups centralized CP test,the test cost can be cut down substantially,and the market competitiveness of the chip products can be enhanced.