Research of Reliability Analysis and Assessment Method for Integrated Electronics System
Zhang You-la · Journal of China Academy of Electronics and Information Technology · 2013
Considering the large number of test samples,high cost of experiment,long time of evaluation and high evaluation index in the current reliability assessment for large-scale electronic system,a small sample of large system Bayes evaluation method is proposed in this paper,which is based on multi-source information fusion. Since the proposed algorithm considers the effects caused by various factors to the reliability assessment for large-scale system comprehensively,it will get accurate evaluate results even when the number of test samples is small. Finally,the feasibility and effectiveness of the proposed algorithm is validate by an example of mission reliability assessment for integrated electronics system.