Testability Study of the Bridging Faults in Static CMOS Circuits
Xin Zhang, Hu Gu · 2000
IDDQ test is suit for the bridging falt test in CMOS circuits, In this paper,Several basic concepts on IDDQ test of CMOS circuits has been given, IDDQ testable condition has been studied, and IDDQ testability of bridging faults of the line-nodes in static COMS circuits been has been proven theoretically.