Uncertainty estimation of calibration equipment for high current pulse source
YU Li-hon · Microcomputer Information · 2012
Pulse Test Method is a popular method in testing semiconductor parameters. High Pulse Current Source is one of the important parts in the whole discrete semiconductor device test system. This article introduced the calibrating installation for semicon-ductor discrete device test system,based on solving calibrated problems,the article also analyzed the main factors that affecting the measurement results of Pulse current amplitude and finally estimated the uncertainties of the measurement.