Metadata-Based Mass Test Data Storage System Study and Design
Bin Liu · Microelectronics & Computer · 2012
With the wide usage of test technology,test has becomes one of the most important methods for product development.The existing test data management system can't solve the test data management problems.This paper based on the background of mass test data management,puts forward test data description language(TDL) that based on Resource Desription Framework(RDF),and supplies mass test data management oriented system design structure,and also presents algorithm of test data analysis.The test data management system meet the demand of openly platform.