Detection method for memory overrun in multi-loop programs
Jia Wang · Journal of the Graduate School of the Chinese Academy of Sciences · 2010
A detection method for memory overrun is presented to overcome multi-loop problems: (1)identifies suspicious defects and their dependent regions;(2)analyzes multi-loops by CR# algebra;(3)infers probability of triggering defect and path guide information;(4)detects defects based on symbolic execution;and (5)finds defects,trigger paths,and program input. A prototype tool has been implemented,and it found real defects in several open source softwares. The results show that the new method can avoid blind path traversal while preserving path-sensitive and bit-level detection precision,and improve efficiency and veracity of defect detection.