One Way of Fault Diagnosis for Combined Logic Circuit
Huang Lan · Techniques of Automation and Applications · 2009
Fault diagnosis of combined logic circuit includes: fault detection,fault location and fault identification.Fault location is most important for troubleshooting and circuit improvement.During this process,identifying circuit position testing set,and generating circuit testing code or testing sequence are key elements.Once location testing set is obtained,testing stimulus could be added sequentially,and then fault could be located according to circuit response.This paper presents a method of testing sequence generation,based on adaptive testing.