The Application of neural networks in the simulation-based test generation algorithm for hybrid circuits
XU Jian-bin · Journal of Circuits and Systems · 2001
A new method for generating the initial test pattern for simulation-based test pattern is proposed. The initial test pattern is generated by means of neural networks. Using this method, blindness when using random algorithm can be avoided, computational complexity for determinate algorithms can also be reduced. Effectiveness is verified by experiment results.