Analysis of RFIC Structural Testing
Shuyan Jiang · 2009
RFIC technology has grown up amazingly along with the development of semiconductor technology.However,there are also many challenges to RFIC's development.Among them,RFIC test is a major bottleneck.In this paper,challenges of RFIC test and three typical RFIC structural test methodologies based on different key technologies,such as thermal monitoring,sensitivity analysis,and neural networks,were analyzed.It is concluded that RFIC structural test is an effective supplement to functional test,and it is also an effective technique to reduce test cost.