MBIST Design for a Radar Signal Processing SOC Chip
Huihua Liu · Microelectronics & Computer · 2008
The Built-In Self Test(BIST) provides a cost-effective solution in testing an embedded memory.Fault types of embedded memory and the March algorithm which is commonly used were introduced at first.In the DFT(Design For Testability) techniques used in a Radar Signal Processing SOC Chip.The BIST circuit was successfully inserted for five pieces of embedded RAM and tow pieces of embedded ROM.In the testing of the SOC chip,the MBIST circuit test the embedded memory successfully and approved that there was no fault in the memory.