Software defect metric based on orthogonal defect classification
Minyan Lu · Jisuanji yingyong yanjiu · 2010
Firstly,according to the orthogonal defect classification,this paper described the defect data information which should be collected before defect measurement execution.Secondly,it described how to use the orthogonal defect classification for measurement analysis from the views of single dimension and multi-dimensional.Thirdly,presented the application process in the software organization.Finally,elaborated the application example.The study of this paper offered a new thought to the application of defect measurement.