Research on Metrological Instrument Management System Based on J2EE

MA Qing-xian · Manufacture Information Engineering of China · 2008

Metrological instrument is a special kind of equipment,it has some particularities and is used in certification,detection and some other cases.It is unbefitting to use simple equipment management system.Aiming at this problem,it presents a solution based on J2EE(Java 2 Platform Enterprise Edition).An actual case shows that the system can help for the metrological instrument management.

Read the paper · More papers on PaperTik