FPGA and MCU Application in RLC Measurement System Design
Xingang Wang · Huagong zidonghua ji yibiao · 2011
A FPGA and MCU-based measurement system for RLC parameter was presented.The system employs the FPGA to generate sine wave,and bases on the circuit reactance components series partial pressure principle to measure resistor,capacitor and inductor,and can display and print measurement results as requested.The simple structure and anti-interference design enhance its reliability in operation.