AN ALGORITHM FOR GENERATING TEST PATTERNS FOR FUNCTIONAL LEVEL DIGITAL CIRCUITS——THE PRINCIPAL PATH SENSITIZATION METHOD
Wei Dai · Chinese Journal of Computers · 1982
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method. This method can be applied to sequential circuits as well as combinational circuits which are composed of functional blocks. It incorporates the advantages of both the boolean difference method and the D- algorithm. It unifies these two methods and makes some improvements. A program based on this method has given satisfactory results in practice.