[Determination of film thickness, component and content based on glass surface by using XRF spectrometry].
Yan Mei, Mi-Xia Ma, Zuo-Ren Nie · PubMed · 2013
Film thickness, component and content based on glass surface were determined by using XRF technic, measure condition and instrument work condition in every layer were set and adjusted for the best measure effect for every element. Background fundamental parameter (BG-FP) method was built up. Measure results with this method were consistent with the actual preparation course and the method could fit to production application.