Auto-identification of symmetric profiles on ICT image in reverse engineering
Bailin Li · Journal of Machine Design · 2011
By considering the symmetry restriction characteristics in machinery industrial product profiles,a method of two-dimensional symmetric contour auto-identification based on feature matching is presented in this paper.Firstly,the feature points are extracted based on profile cloud point data partition and by using offset method,the different distribution rules of axial symmetric and rotational symmetric images for judging the type of symmetry was studied.The symmetric profile feature description parameter was calculated by adopting rotational inertia method and periodic method,which is regarded as the parameters for solving the profile overall constraint optimization.Examples show that method in this paper can effectively identify the symmetric profiles and their types,and extract the symmetric constraint features.