A Study on Data Acquiring Technique in Semiconductor Packaging Test Based on Virtual Machine
Dai Min · Electro-mechanical Engineering · 2005
It is hard to acquire test data form variant type of semiconductor packaging test machine,because the data format of variant machine is different.A data acquiring technique based on virtual machine is introduced to solve this problem.In this technique,the format of test data file is described and the test data file will be dynamically decoded and translated by variable type table,variable search table,operate symbol table,function search table and so on.As a result,multi machine data interface is established flexibly by this technique.