Built-in Self Test Study for Stuck-open Faults of CMOS Combinational Circuits
Pushan Tang · 2005
Two Built-in self-test methods for Stuck-open faults testing of CMOS combinational circuits are proposed. In the first method, the transition number of CUT's output is counted and then compared to the anticipant one of the fault-free circuit. For an n-inputs CMOS combinational circuits, 6×2~n test vectors are needed to finish the BIST process and all the Stuck-open faults can be tested. Another method is ROM-based adaptive BIST, which efficiently utilizes the properties of Stuck-open faults. simulation result shows it can accomplish self test within 3×2~n+1 test vectors. Meanwhile, CUT modification is no longer needed and 100% fault coverage for multiple Stuck-open faults can also be achieved.