Design of the Test System for Multi-ICs Based on VI Technology
WU Ji-duo · Keisou gijutsu · 2005
A kind of test system for multi-ICs based on VI technology was developed. The design scheme and the hardware configration of the testing system and the software design method in LabWindows/CVI were introduced in deteail. The adoption of GPIB and RS232 has greatly developed the control and universality of the test system.