Measurement and Analysis of the Forward-biased Emitter-base Capacitance
Zhenggang Zhou · 2003
The emitter capacitance of transistor has a very important effect on the frequency performance of the transistor.It's still an important topic to measure correctly the forward-biased emitter-base capacitance.A method of combining the AC measurement and the DC measurement to measure the forward-biased emitter-base capacitance of the transistor is presented.The relation between the capacitance and the biased voltage is also analyzed.The measurement is also made on the transistor in the test structure on the wafer.The range of the base transit times is estimated and the emitter-base space-charge region capacitance under middle range forward-biased voltage is obtained.