Fault Diagnosis Method for Indicator Diagram Based on Fourier Descriptors
Wei Zhang · Chemical Engineering & Machinery · 2013
The fault diagnosis method of extracting the contour line features based on Fourier descriptors was proposed.Through using eight-neighborhood search and morphological refining to extract contour line,the Fourier descriptor of contour line boundary point sequence was calculated to ensure image's constantness in rotation,zooming and panning;and inputting the Fourier descriptor as the feature to distance classifier can realize intelligent diagnosis of the fault.The experimental result shows that this method can recognize the fault types of the indicator diagram effectively.