Facial feature point localization based on MR-AAM dual-fitting
Xun Gong · Journal of Computer Applications · 2011
The original inverse compositional Active Appearance Model(AAM) only does one fitting process.When the initial position is far away from the destination,the model often falls into local minimum and becomes hard to converge into the correct position.Against this problem,a dual fitting method using Multi-Resolution AAM(MR-AAM) was proposed.Firstly,the first time fitting was to locate the initial position of the face in the low-resolution AAM,and the second time fitting was to use inverse compositional algorithm in the high-resolution AAM.This method can find the exact initial position and achieve better result of facial feature point localization.The experimental results show that the proposed method performs better than traditional method in the fitting accuracy along with the real-time case.