Application of radio frequency admittance in material level measuring of conductive medium
LU Hong-juan · Information technology newsletter · 2010
When the capacitance level meter measures the conductive medium,the measured results are easily influenced by its probe attachment.This paper tries to analyze the forming causation of probe attachment and its effect on measured results,puts forward the method to resolve the problem of probe attachment by the RF admittance technology and gives out the feasible scheme of the RF admittance capacitance level measuring system.