Discussion of Sequential Circuits Testing Method Based on Finite State Machine
HE Guang-jin · Dianzi qijian · 2008
Aiming at the complicated character of the sequential circuits, we use the fault model of state trasition to achieve the testing generation of the sequential circuits, which is based on state transition of the finite state machine and conference testing.The result proves that it can transform quickly from sequential circuits to finite state machine if we use the VHDL and EDA software, meanwhile,the stable state and valid reachable state of the sequential circuits can be also achieved. Therefore, we have gotten an effective method on the testing generation of the sequential circuits, because it realizes the test genenration for the state trasition fault model.