Research on the Evaluation Method for the RAM Goals of CTCS-3
Wang Yongnian · Zhongguo tiedao kexue · 2010
To evaluate the Reliability,Availability and Maintainability(RAM)of CTCS-3,a reliability block diagram was constructed by top-down layer decomposition.The lowest level of the reliability block diagram was the smallest replaceable unit of CTCS-3.The failure rate and repair rate of the smallest replaceable unit can be gotten by reliability prediction and maintainability prediction.With the failure rate and repair rate of the smallest replaceable unit,according to the reliability block diagram and Markov model,CTCS-3 reliability indexes can be gotten by bottom-up layer calculation.Similarly,CTCS-3 maintain-ability indexes can be obtained according to the failure rate and the maintenance time of each smallest replaceable unit.CTCS-3 availability indexes can be calculated based on the obtained CTCS-3 reliability indexes and maintainability indexes.With the calculated RAM indexes,whether the system meets the requirement or not can be judged.