The research of multi - fault test generation for combinational logic circuits
YU Hong-juan · Dianji yu kongzhi xuebao · 2005
For the problem that the Boolean difference algorithm need many exclusive OR operations, especially for the solution of multiple stuck - at faults test generation. This paper is based on the Karnaugh map to do the exclusive OR operation, and presents a simplified method of multiple stuck - at faults test generation for combinational circuits by the research of the Boolean difference algorithm. This method is not more difficult when increasing the multiplicity of the targeted fault, if only the number of variable for function is not changed. So that time for multi - fault test generation is much shorter.