The Measurment of Complex Dielectric Constant on Auto-Slotted Line by S-Parameter Method
Ang L · Journal of Shanghai Normal University · 1989
The S-Parameter Method was rarely used to measure complex dielectric constant because of its complicated procedure and difficult data-processing. In this paper, a technique, based on S-Parameter Method, developed on the auto-slotted line is presented in which computer is applied to the test procedure. A novel method of data-processing is also presented. With our method, the measurment can be made both quickly and accurately. Finally, some results are given.