Combination of Reliability Growth Model and Orthogonal Defect Classification and Application to Qualitative Analysis of Process
Wei Chen · Science Technology and Engineer · 2005
Software process measurement and analysis are an important research aspect in the field of software engineering. Traditional reliability growth models can present signal alerts and orthogonal defect classification method can measure the software defects but both cannot provide guidance directly for the software process. The reliability growth model combines with different defect type of ODC and projecting them on a common abscissa to make qualitative inferences.