BIST Test Vector Generator for I_(DDT) Testing
Kuang Ji · Computer Engineering and Science · 2005
To test the open-circuit failures in CMOS circuits usually needs to use test vector pairs.Built-in self-test(BIST)is used as an effective test technique and it can gveatly reduce test overheads.This paper adopts a regular,mudular and over lapped automatic control unit (CA) to construct the BIST modules for generating test vector pairs.Experiments show that the method is effective in transient current testing.