A JTAG Standard-based Test Circuit Design for SOC System
Zhiyi Yu · 2003
Along with the more complicated integrated circuit system and the emergence of IP-based SOC system, the test of IC system becomes more difficult and faces new challenge. In this paper we design a JTAG-based test circuit design after studying some important kinds of test techniques. It embraces some different test techniques at the little cost of the circuit complexity and overcomes some difficult issues in the test of IP-bases SOC system. We also give the test strategy based on this circuit.