Using Hough Transform in Surface Defect Detection of Chip
Pengfei Shi · Measurement & Control Technology · 2006
According to the shape of the specific chip image,a new geometric image registration algorithm based on improved Hough transform is presented.By using the gradient direction information of edges and the specific geometric property of circle,the three-dimensional Hough transform space is reduced to a two-dimensional one,thus the problems such as long computational time and large storage in common general Hough transform can be solved.Experiments show that the algorithm is effective to match the two images for surface defect detection.