Hierarchical Bayesian Estimation of the Products Reliability Based on Zero-Failure Data
Han Ming · 系统科学与系统工程学报(英文版) · 1999
With the development of science and technology, the products reliability is higher and higher. So for high reliability products, zero\|failure data situation appears often in the time ended reliability tests. In this paper, the hierarchical Bayesian estimation of the products reliability is given under the conditions of the Binomial distribution with zero\|failure data and the prior distribution of the reliability being quasi\|Beta distribution. The authors also give a practical calculating example using the theory.