MEASUREMENT BASED DELAY FAULT DIAGNOSIS
Hua Li · Chinese Journal of Computers · 1999
Delay fault diagnosis requires more accurate fault models than delay fault detection. This paper presents a delay model and a delay fault model using the method of accurate measurement. A reduced test set is obtained by using the principle of circuit path graph, which is coherent with the topological structure of the circuit under test. The size of the test set is linear to the size of the circuit under test, while the number of paths is exponential. Each test sensitizes a path under the concept of single transition sensitization to enable the measurement of the path delay. Therefore, a delay fault symptom of the circuit respecting to the test set is obtained. This paper presents a diagnosis approach on a delay fault syndrome for transition delay fault on a single line. This approach can locate the fault to a very small set of lines, even to a single line. The experimental results show that the average rate of successful diagnoses is 93.55%, and the average diagnosis resolution is 1.61. Thus, this approach is efficient. The paper also explains that under the concept of single transition sensitization, why a few diagnoses fail. For the failed diagnosis, the paper shows that the diagnosis result is equivalent to the actual fault.