New Integrated Test System of Electromagnetic Relay
Xiangjun Liu · Jiangsu Electrical Apparatus · 2007
New method of testing the electromagnetic relay's parameters is introduced. The integrated test system in which the single chip microcomputer which is taken as the central processing unit can test the relay parameters automatically. In the test process, the memory oscilloscope communicates with the RS-232 to pass the real-time dynamic waveforms to the computer. The computer obtains the data by sampling and analyzing the waveforms by means of the OPENCHOICE software, then processes the data further and displays the test results through the VB advanced language. Through testing the parameters of magnetic latching relay, the system has convenient operation, friendly interface and higher dispose precision. It can provide basis for the design and improvement of the electromagnetic relays in the process of R D.