Automated Test Pattern Generation for Combinational Circuits Based on SAT
Xiang Huo · 2011
Automated test pattern generation(ATPG) algorithms for both stuck-at and delay faults were implemented based on satisfiability(SAT) solving.Topology of the circuits was discussed in detail,as well as encoding ATPG problems into conjunctive normal forms(CNFs),which were solved by zchaff,an efficient Boolean SAT solver.The proposed algorithms were tested using a set of ISCAS85 benchmarks to demonstrate their effectiveness.