A Test Generation System Based on NeuralNetwork Expert System Method
Cat La · 1997
In this paper TES, a test pattern generation system implemented on a microcomputer is presented. Based on neural network expert system approach , the system generatesa neural network for the circuit under test and obtain the test patterns by means of CauchyMachine. Some strategies used in TES system, such as sensitized path, implying nede and circuit partition, are also discussed. Experimental results show the system has better performance.