Study of 1/f Noise by Means of Wavelet Analysis and Virtual Instrument Technology

Bao Jun-Lin · Dianzi qijian · 2006

As a traditional method, the system based on Fourier analysis and frequency spectrum analyzer can not be used to test 1/f noise timely, fast and accurately.A testing and analyzing system based on wavelet analysis and virtual instrument is set up, by which 1/f noise is studied in theory and experiment. Experimental results demonstrate that this system can be used to test 1/f noise which is lower two scale than what can be tested by a traditional system. Two parameters are presented based on wavelet theory and are well used to characterize 1/f noise: wavelet maxima can be used to probe differect generation mechanisms of 1/f noise and similarity coefficient to picture effects of stress on 1/f noise

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