DFT for IP Cores Based on Deterministic-BIST
Bo Hong · Bulletin of Science and Technology · 2006
Analyze the pros and cons of Full-Scan and Logic BIST in chip DFT application.Introduce the attributes of a method named DBIST and its corresponding EDA tool,Synopsys SoCBIST.As compared with the results generated by Full-Scan,paper points out that DBIST has some overwhelming advantages such as short test time,small test vector file,high test coverage,at-speed supporting and feasibility in SoC testing.