The Fuzzy Test Generation Algorithm for Sequential Circuits
Xiao Liu · Microelectronics & Computer · 2002
This paper mainly proposes a fuzzy test generation algorithm for sequential circuits. In our method, the fault value is represented fuzzily as symbolic value, and several key techniques are used to generate test vectors to achieve high fault coverage at low computational complexity. This new algorithm combined with two phases. The first phase it generate the test vector by computing the fault value of the state line,and find the fault value of the fault point by computing it's normal value using the first input value of the test sequence. In the second phase, use the normal value of the fault point as constraint condition generating another test vector of the fault point. This method is radically different from the conventional methods,and it doesn't need the process of propagation and backtracks. Some experimental results on the benchmark circuits demonstrate the feasibility of this algorithm.