Object Oriented Fault Detection for Fault Models of Current Testing
Sung-Hwan Bae, Jong-Kil Han · The Journal of the Korea institute of electronic communication sciences · 2010
Current testing is an effective method which offers higher fault detection and diagnosis capabilities than voltage testing. Since current testing requires much longer testing time than voltage testing, it is important to note that a fault is untestable if the two nodes have same values at all times. In this paper, we present an object oriented fault detection scheme for various fault models using current testing. Experimental results for ISCAS benchmark circuits show the effectiveness of the proposed method in reducing the number of faults and its usefulness in various fault models.