Discussion of Sequential Circuits Testing Method Based on Hopfield-Neural Network
Sen Zhang · Dianzi qijian · 2006
This paper offers a method to transform the sequential circuits to the digital circuits borrowing the hypothesis ideas, and combines the characteristic of sequential circuits to get its vector of test, for the questions of logical initialization. If we use the software of the EDA to simulate the waveform of normal circuits the result proves that the circuits can be steady very quickly, Furthermore, we can get the different second-digital circuit by using the different feedback. Therefore, we can conclude that we can get the testing generation and an effective method of researching the fault testing generation in the sequential circuits.