Small sample statistical theory and IC reliability assessment
Yao Ruo-he · Kongzhi yu juece · 2008
Small sample reliability assessment methods are becoming more and more important.The traditional small sample reliability assessment is based on Bayes method,which can use prior information to evaluate the reliability.A new approach,support vector machine(SVM),can be used to assess the reliability of IC with small sample.Bayes method and SVM are used widely in software reliability assessment and reliability forecasting nowadays.It will decrease the test time and improve efficiency for IC reliability assessment if Bayes method is integrated with SVM.