The Development of a Precision LCR Test Set
De Chen · Jiliang xuebao · 2003
A kind of LCR test system is introduced. This system can test the performance (resistance, inductance, capacitance) of a device in the frequency range of 75 kHz～30 MHz. The key technology in the system is described, including the technologies of testing impedance using autobalance bridge, 75 kHz～30 MHz frequency synthesis, automatic level control, phasic detection and vector measurement, A/D transforming, and fourterminal pair. The test error sourses and the method for reducing errors have been studied. A mathematical model of the calibrator is given. The experiment results show that the basic precision of this test set is 01%, the frequency range is 75 kHz～30 MHz and the level range is 5 mV～2 V.