A Scan Based DFT Design and Implementation
Duan Chun-li · Microelectronics & Computer · 2008
DFT technology has become an important part in IC design.The theory and method of scan-based test is introduced in detail and an example of 32-bit FIFO memory using DFT technology is presented.According to the characteristic of scan chains and muliti-clock in the circuit,three strategies have been used in the design from code modification,scan synthesis to the final ATPG.The result of fault coverage is presented.By compression,the patterns are optimized and the simulation time is reduced.Finally some factors and considerations have been analyzed leading to the differences of the fault coverage.