Test Generation Algorithm Based on Search State Dominance for Combinational Circuits
MA Huai-jian · Harbin Ligong Daxue xuebao · 2005
The EST algorithm presents the concept of search state equivalence for first time,and describes the different search state of test pattern with E-frontier.With the concept of state equivalence,the search space of test pattern has got smaller.This paper gives a new test generation algorithm based on search state dominance with the research for search state equivalence.This method can decrease the search space,and the time for test generation is shorter.