Study on Fault Localization Method for Embedded Software Regression Testing
Yongmei Liu · Journal of Inner Mongolia University · 2011
The modification of the embedded software is a difficult task because of the complexity and it is easy to import new bugs.The importance of regression testing in the life cycle of embedded software development is emphasized.After detailed analysis of previous regression testing method,a new regression testing method for fault localization is proposed based on program frequency and atom dependence,which can be applied to embedded software.