A Universal Automatic Test System Integreted on VXI Equipment
Hong Zhang · Ceshi jishu xuebao · 2000
Aim To develop a high performance universal automatic test system. Methods It is integreted on VXI equipment and is managed by using a date base. Results Advanced system technology, high fault detect rate and good universility and scalability are shown. Conclusion The system fits for the detection, diagnostics and maintainance of the different electronic products.