The Architecture Design of Test Circuits of the TFT-LCD Driver IC Used for Mobile Phone
Xiaoya Fan · Microelectronics & Computer · 2006
In this paper,the test requirement and architecture of the TFT-LCD driver IC used for mobile phone are analyzed,and a design method of test circuits for this kind of driver IC is proposed.Multi scan path method is used for realizing the independent test of all circuit blocks,and the BSD method is used for the test of built-in SRAM with special architecture,which improved the flexibility of test and reduced the chip size of test circuits.The LSSD method is used for source driver test that is easy to control.The design method proposed in this paper can support normal and special tests of TFT-LCD driver IC very well.